Get updates on Eligibility, Admission, Placements Fees Structure
Quick Facts
| Medium Of Instructions | Mode Of Learning | Mode Of Delivery |
|---|---|---|
| English | Self Study | Video and Text Based |
Course Overview
The Techniques of Materials Characterization certification course offers a comprehensive exploration of material structure analysis. The course spans 12 weeks and delves into microscopy techniques such as light/optical and electron microscopy, alongside diffraction phenomena using electron and X-ray sources. Emphasis is placed on real-world applications and problem-solving in materials research.
Catering to final year undergraduates, postgraduates, and PhD students, the Techniques of Materials Characterization certification by Swayam equips learners with fundamental knowledge in materials characterisation. Upon completion, students earn three credit points, with industries in metal making, semiconductor device manufacturing, and biomedical applications among those benefiting from the acquired skills.
Also Read: Online Materials Science And Technology Certification Courses
The Highlights
- Core Online Course
- 12 Weeks Duration
- Offered by IIT Kharagpur
Programme Offerings
- Certificate of completion
- Practical Learning
- Hands-on Experience
Courses and Certificate Fees
| Fees Informations | Certificate Availability | Certificate Providing Authority |
|---|---|---|
| INR 1000 | yes | IIT Kharagpur |
The Techniques of Materials Characterization certification fees is free. However, if you want a certificate, you must register and take the proctored exam at designated centres, which is optional and comes with a fee of Rs 1000.
Techniques of Materials Characterization Certification Fee Structure
Particulars | Total Fees |
Techniques of Materials Characterization (exam) | Rs 1000/- |
Eligibility Criteria
Academic Qualifications
The Techniques of Materials Characterization certification course is intended for final year undergraduate and postgraduate students, as well as PhD researchers in fields such as Materials Engineering, Nanoscience, Physics, and Chemistry, with the only requirement being introductory courses in Materials Science and Engineering.
Certification Qualifying Details
To receive the Techniques of Materials Characterization certification by Swayam, you need a minimum average assignment score of 10/25 and an exam score of 30/75.
What you will learn
After completing the Techniques of Materials Characterization certification syllabus, you will delve into a comprehensive understanding of various techniques used for materials characterisation. You will also explore microscopy, including both light/optical and electron microscopy, learning how to analyse and interpret microstructures of materials.
Upon completion of the Techniques of Materials Characterization training, you will gain insight into diffraction phenomena utilising electron and X-ray sources, enabling you to probe deeper into the internal structure of materials. You will also learn the fundamental principles behind image formation, diffraction, and their applications in materials research.
Who it is for
The Techniques of Materials Characterization online course is suitable for final-year undergraduate and postgraduate students, as well as PhD researchers, across various disciplines such as Materials Engineering, Nanoscience, Physics, and Chemistry. This course is also beneficial for:
Admission Details
Follow these steps to join the Techniques of Materials Characterization classes:
Step 1: Browse the URL below:
https://onlinecourses.nptel.ac.in/noc23_mm26/preview
Step 2: Click on the “Sign-in/ Register” button
Step 3: Fill out the necessary details and submit the form
The Syllabus
Introduction to microscopy
- Basic principles of image formation
- General concepts of microscopy: resolution. Magnification, depth of field, depth of focus etc.
Optical microscopy
- Image formation, contrast development
- Basic components (light sources, specimen stage, lens system, optical train etc.)
Various modes of optical microscopy
- Bright field mode (transmission vs. reflection)
- Contrast enhancing modes (dark field, polarized light, interference contrast, fluorescent microscopy etc.)
General concepts of electron microscopy
- Basic components of electron microscope (electron gun, electro-magnetic lenses etc.)
- Aberrations (chromatic, spherical, astigmatism etc.) and their corrections
- Electron-materials interaction (elastic vs. inelastic scattering, coherent vs. incoherent scattering, interaction volume)
Transmission electron microscopy (TEM)
- Image formation and contrast generation (mass-thickness contrast, atomic number contrast, diffraction contrast etc.)
- Modes of TEM (bright field, dark field, HAADF, STEM)
Electron diffraction in TEM
Scattering of electrons in crystalline material (Braggs law, zone axis, order of diffraction etc.)
Electron diffraction in TEM
- Concept of reciprocal lattice, Ewald sphere, diffraction from finite crystal
- Diffraction pattern (Single crystal vs. polycrystalline diffraction, selected area diffraction etc.),
- Indexing of diffraction pattern (camera constant, structure
- Application of electron diffraction (DF imaging, dislocation contrast, phase identification etc.)
Scanning electron microscopy (SEM)
- Working principle in scanning mode
- Signal generation: Inelastic scattering (Secondary vs. backscattered electron, Auger electrons, characteristic X-ray emission etc.)
Basic components of SEM
- Detectors: SE (E-T detector), BSE (scintillator vs. solid state), in-lense detector
- Optics of SEM (magnification, pixel, resolution, depth of field)
- Resolution in SEM (minimum probe size, beam current etc.)
Chemical analysis in SEM
- EDS and WDS detectors
Imaging and contrast generation in SEM
- Topographic imaging (in SE & BSE mode)
- Compositional imaging (BSE mode)
X-ray production
- Electromagnetic radiation, continuous spectrum, characteristic spectrum
- X-ray absorption (adsorption edge, excitation voltage, Auger effect etc.), X-ray filters
Intensities of diffracted beams
- Scattering by single electron (Thomson and Crompton scattering)
- Scattering by single atom: atomic scattering factor
Intensities of diffracted beams
- Scattering from unit cell: structure factor calculation for various crystal systems
- Multiplicity factor and temperature factor
X-ray diffraction profile and analysis
- FWHM and line broadening
- Crystallite size effect and Scherrer formula
- Effect of strain (tensile vs compressive, uniform vs. non-uniform)
- Amorphous vs. crystalline materials
Evaluation process
The Techniques of Materials Characterization certification offers an optional exam. Your final score is determined by averaging the best 8 out of 12 assignments (25%) and your proctored exam score (75%).
IIT Kharagpur Frequently Asked Questions (FAQ's)
Yes, you can enroll in this course even without a background in Materials Science and Engineering. However, it is recommended to have some introductory knowledge in the field.
This course will equip you with essential skills for analyzing and characterizing materials, which are highly valued in industries such as metal making, semiconductor device manufacturing, and biomedical applications.
The only prerequisite for this course is to have completed introductory courses in Materials Science and Engineering. This foundational knowledge will help you grasp the concepts covered in the course.
The course is delivered online through lectures, presentations, and interactive sessions. You will have access to course materials, assignments, and discussions through the online platform.
Yes, upon completion of the course, you will earn three credit points. This certification can enhance your academic credentials and demonstrate your proficiency in materials characterization techniques to potential employers.