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Quick Facts
| Medium Of Instructions | Mode Of Learning | Mode Of Delivery |
|---|---|---|
| English | Self Study | Video and Text Based |
Courses and Certificate Fees
| Fees Informations | Certificate Availability | Certificate Providing Authority |
|---|---|---|
| INR 2182 | yes | Coursera |
The Syllabus
- Videos
- Introduction
- History of Electron and Ion Microscopy
- A Microscope and an Image
- Magnification, Resolution and Contrast
- Electron Sources. Thermionic Emission and Field Emission
- Electron Guns and Their Parameters
- Ion Sources
- Electrostatic Lens
- Magnetic Lens
- Octupoles, Quadrupoles and Aberrations
- Detectors
- Everhart-Thornley Detector
- Semiconductor Detector
- Particle Scattering in Matter
- Elastic Scattering
- Inelastic Scattering
- Energy Losses and Stopping Power
- Secondary Electrons
- Characteristics X-rays and Auger Electrons
- Electron and Ion Range in Matter
- Readings
- Refractive Index in Electron Optics
- Components of Vacuum Systems
- Presentation
- Practice Exercises
- Test
- Test
- Test
- Test
- Test
- Test for module 1
- Videos
- SEM Working Principle
- SEM Electron Optics
- Modes of SEM Electron Optics
- SEM Detectors and Specimen Chamber
- Back-scattering Electron Yield
- Contrasts With BSE Detector
- Contrasts With SE Detector
- Effects of Surface Charge in SEM
- Methods of Surface Charge Compensation in SEM
- Reading
- Presentation
- Practice Exercises
- Test
- Test
- Test for module 2
- Videos
- Transmission Electron Microscope
- TEM Illumination System and Specimen Holder
- TEM Diffraction Mode
- TEM Bright Field and Dark Field Modes
- TEM Spot Mode and STEM
- Diffraction Vector, Ewald Sphere and Excitation Error
- Kinematical Model of Electron Diffraction
- Structure Factor and Forbidden Reflexes
- Column Approximation and Dynamical Theory of Diffraction
- Electron Diffraction from Polycrystalline and Amorphous Materials
- Kikuchi Electron Diffraction
- TEM Contrasts
- Mass-thickness Contrast and Z-contrast
- Diffraction Contrast. Thickness and Bending Effects
- Phase Contrasts
- High Resolution TEM
- Readings
- Sample Preparation in Transmission Electron Microscopy
- Presentation
- Practice Exercises
- Test
- Test
- Test
- Test for module 3
- Videos
- Ion Microscopes, FIB and Dual Beam Systems
- Ion Optics
- SIM and FIB-SEM Detectors and Specimen Chamber
- SIM Contrasts
- Sputtering With Focused Ion Beam
- Ion Beam Induced Deposition
- TEM Specimen Preparation With FIB-SEM System
- Ion Beam Induced Defects
- Reading
- Presentation
- Practice Exercises
- Test
- Test
- Test for module 4
- Videos
- X-ray Spectrum and Spectrometers
- Energy-dispersive X-ray Spectrometer
- Wavelength-dispersive X-ray Spectrometer
- Qualitative X-ray Microanalysis in SEM
- Quantitative X-ray Microanalysis in SEM
- Features of X-ray Microanalysis in TEM
- Quantitative X-ray Microanalysis in TEM
- EELS Spectrum
- EELS Spectrometers and Filters
- Analysis of EELS Spectrum
- Reading
- Presentation
- Practice Exercises
- Test
- Test
- Test for module 5
Articles
3 Dec'24, 12:19 PM
3 Dec'24, 08:59 AM
2 Dec'24, 12:54 PM
2 Dec'24, 12:31 PM
30 Nov'24, 01:01 PM
30 Nov'24, 01:00 PM
30 Nov'24, 12:59 PM
30 Nov'24, 10:26 AM
29 Nov'24, 09:40 AM
29 Nov'24, 08:38 AM
2 Dec'24, 12:54 PM
29 Nov'24, 06:03 AM
19 Nov'24, 10:59 AM
2 Nov'24, 03:12 PM
2 Nov'24, 06:52 AM
11 Oct'24, 06:01 AM
13 Mar'24, 06:24 AM
29 Feb'24, 06:05 AM
27 Feb'24, 10:32 AM
13 Feb'24, 06:25 AM
3 Dec'24, 12:19 PM
3 Dec'24, 08:59 AM
2 Dec'24, 12:54 PM
2 Dec'24, 12:31 PM
30 Nov'24, 01:01 PM
30 Nov'24, 01:00 PM
30 Nov'24, 12:59 PM
30 Nov'24, 10:26 AM
29 Nov'24, 09:40 AM
29 Nov'24, 08:38 AM
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